Pla Decomposition to Reduce the Cost of Concurrent Checking
نویسندگان
چکیده
In this paper 1 we propose a combination of PLA decomposition and unidirectional error detecting techniques which permits concurrent testing for all single faults in a circuit (both in the decomposed modules and on the interconnection lines), for a lower area overhead cost than is normally associated with unidirectional error detecting codes.
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